|
TYPICAL
IMPURITIES |
|
SILICON CARBIDE COATING
|
|
|
| Element |
Content/ppm (wt) |
Element |
Content/ppm (wt) |
| Boron
B |
.04 |
Copper
Cu |
<0.05 |
| Sodium
Na |
<0.01 |
Zinc
Zn |
<0.05 |
| Megnesium Mg |
<0.01 |
Gallium
Ga |
<0.05 |
| Aluminum
Al |
<0.01 |
Germanium
Ge |
<0.05 |
| Phosphorus P |
<0.01 |
Arsenic
As |
<0.05 |
| Sulfur
S |
0.04 |
Indium
In |
<0.01 |
| Potassium K |
<0.05 |
Tin
Sn |
<0.05 |
| Calcium
Ca |
<0.1 |
Antimony
Sb |
<0.05 |
| Titanium
Ti |
<0.01 |
Tungsten
W |
<0.01 |
| Vanadium
V |
<0.005 |
Tellurium
Te |
<0.01 |
| Chromium Mn |
<0.1 |
Lead
Pb |
<0.01 |
| Manganese Mn |
<0.01 |
Bismuth
Bi |
<0.01 |
| Iron
Fe |
<0.01 |
|
|
| Nickel
Ni |
<0.01 |
Total Impurities |
<2 ppm |
|
|
Test Method : GDMS
"<" : shows less than Detection Limit.